CSE 244A Winter 2004
VLSI Testing
Professor Arther D. Friedman adfriedm@cs.ucsd.edu
Teacher Assistant: Raid Ayoub rayoub@cs.ucsd.edu
Course Description: Fault models and test, Combinational circuit test generation, Fault collapsing, Fault Simulation, Synchronous circuit testing, Functional testing, Memory
Prerequisite: Logic Design Course CSE241A
Reference text: Jha&Gupta, Testing of Digital Systems, Cambridge University Press, 2003
TA office hours: EBU-1 Room 6307C
Friday 8:30-10:30 am or by appointment