CSE 240 - FALL '96
Questions & Answers
Question: Hi, I have a question regarding the homework 1.
Specifically, question
1.8 part c on page 63. To answer the question I need to
calculate the Die
Cost, the Testing cost, and the Packaging Cost. The Die Cost
and the Packagi
ng cost are obvious, but not the Testing Cost. Can you tell
me how to find the
Testing Cost for MIPS 4600? Thank you for your help.
Answer: Testing Cost = (Cost per Unit * Testing
time) / (Die Yield).
All necessary data is in Figure 1.23. Check the solutions for
details.
Question: Hi. In studying for the midterm, it
seems that most of the homework
problems (from chapt 3) require knowledge of the material
found in section 3.
5.
However, Dr. Orailoglu said that we'd only be responsible for
the
material covered in class, which was through 3.4. Will the
problems
from chapter 3 be included on the test anyway?
Also, I'm having a hard time understanding question 1.2. Can
you explain
it another way? thank you.
Answer: You can skip the sections of the problems
that need material from section 3.5 for the 1st midterm. You
are responsible up to page 161. However make sure that you
study the rest of the problems from chapter 3 since there are
definetely going to be problems from this chapter on the
midterm. We can go over problem 1.2 in the discussion section
(Monday 21 Oct 2-3 pm CENTR218). If you can't make it, let me
know and I will try to e-mail you explanations.