Announcements
- 11/18: DfT slides uploaded.
- 11/17: Homework 2 solutions are posted.
- 11/6: Recent lecture slides are uploaded.
- 11/4: Paper assignment and HW2 are posted.
- 10/28: Homework 1 solutions are posted.
- 10/23: The journal reading list is available.
- 10/21: The lecture slides for Chapter 7 are posted.
- 10/14: Homework 1 was handed out in class and posted on the website.
- 10/9: The lecture slides for Chapter 1 and 4 are posted.
- 10/2: Sign up for our Piazza Discussion Board here.
Course Information
Instructor: Alex Orailoglu, alex@cs.ucsd.edu
Lecture: Mondays and Wednesdays 5:00 — 6:20 PM; EBU3B 2154
Office Hours: Mondays 2:30 — 3:30 PM and Thursdays 1:30 — 2:30 PM; EBU3B 3134
Tutor: Leon Li, xul065@eng.ucsd.edu
Text Book: Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits,
by M.L. Bushnell and V.D. Agrawal, Springer, 2000. Available online in the UCSD library.
Recommended Text Book: VLSI Test Principles and Architectures, edited by L.-T. Wang,
C.-W. Wu, and X. Wen, Morgan Kaufmann, 2006.
Evaluation:
- Homework - 16%
- Paper Review - 12%
- Midterm 1 - 24% : October 30, 2019
- Midterm 2 - 24% : November 20, 2019
- Midterm 3 - 24% : December 4, 2019
Handouts and Slides
- Course Information
- Course Contents
- Reading List
- Reading List Assignment
- Lecture 1 Slides PDF (Chapter 1 Introduction)
- Lecture 2 Slides PDF (Chapter 4 Fault Modeling)
- Lecture 3 Slides PPT (Chapter 7 ATPG Basics)
- Lecture 4 Slides PPT (Chapter 7 D Algorithm & PODEM)
- Lecture 5 Slides PPT (Chapter 7 FAN & SOCRATES)
- Lecture 6 Slides PPT (Chapter 6 SCOAP)
- Lecture 7&8 Slides PPT (Chapter 8 Sequential ATPG)
- Lecture 9 Slides PPT (Chapter 5 Simulation)
- Lecture 10 Slides PPT (Chapter 3 Yield Analysis)
- Lecture 11 Slides PDF (Chapter 14 DfT)