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RSSL
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 | Sule Ozev and Alex Orailoglu.
``Cost-Effective Concurrent Test Hardware Design
for Linear Analog Circuits''
Proceedings of the IEEE International Conference on Computer Design: VLSI in
Computers,
September 2002, pp. 258-264. [pdf]
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| Ismet Bayraktaroglu and Alex Orailoglu.
``Concurrent Test for Digital Linear
Systems''
IEEE Transactions on Computer-Aided Design,
Vol. 20, No. 9,
September 2001, pp. 1132-1142. [pdf]
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| Ismet Bayraktaroglu and Alex Orailoglu.
``Accumulation-Based Concurrent Fault Detection for Linear Digital State Variable Systems'',
Proceedings of the Ninth
IEEE Asian Test Symposium,
Taipei, Taiwan, December 2000. [pdf]
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| Samuel N. Hamilton, Andre Hertwig and Alex Orailoglu.
``On-Line Test for Fault Secure Fault Isolation'',
IEEE Transactions on VLSI Systems,
Vol. 8, No. 4, August 2000, pp. 446-452. [pdf]
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| Ismet Bayraktaroglu and Alex Orailoglu.
``Unifying Methodologies for High Fault Coverage Concurrent and
Off-Line Test of Digital Filters'',
IEEE International Symposium on Circuits and Systems,
Geneva, Switzerland, June 2000, pp. 705-709. [pdf]
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| Ismet Bayraktaroglu and Alex Orailoglu.
``Cost Effective Digital Filter Design for Concurrent Test'',
IEEE International Conference on Acoustics, Signal and Speech Processing,
Istanbul, Turkey, June 2000, pp. 3323-3326. [pdf]
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| Ismet Bayraktaroglu and Alex Orailoglu.
``Low Cost Concurrent Test Implementation for Linear Digital Systems''
Formal Proceedings of the IEEE European Test Workshop,
Lisbon, Portugal, May 2000, pp. 140-143. [pdf]
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| Yiorgos Makris, Ismet Bayraktaroglu and Alex Orailoglu.
``Invariance-Based On-Line
Test for RTL Controller-Datapath Circuits'',
Proceedings of the IEEE VLSI Test Symposium,
Montreal, Canada, April 2000, pp. 459-464. [pdf]
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